MVAID 2022 - 2022 International Conference on Machine Vision, Automatic Identification and Detection (MVAID 2022)

Website http://mvaid.net/ | Edit Freely

Category Machine Vision, Automatic Identification and Detection

Deadline: April 12, 2022 | Date: April 22, 2022-April 24, 2022

Venue/Country: Nanjing, China, China

Updated: 2022-03-25 18:14:32 (GMT+9)

Call For Papers - CFP

Homepage: http://mvaid.net/

April 22-24, 2022

Nanjing, China

Welcome to MVAID 2022

It’s our great pleasure to invite you to join us for the 2022 International Conference on Machine Vision, Automatic Identification and Detection (MVAID 2022)[2022年机器视觉、自动识别与检测国际学术会议], which will be held on April 22-24, 2022 in Nanjing, China. MVAID 2022 will provide a forum within the international academic and engineering community in the field of Machine Vision, Automatic Identification and Detection.

The annually-held MVAID conference aims to gather professors, researchers, scholars and industrial pioneers all over the world. MVAID is the premier forum for the presentation and exchange of past experiences and new advances and research results in the field of theoretical and industrial experience. The conference welcomes contributions which promote the exchange of ideas and rational discourse between educators and researchers all over the world. The organizing committee of conference is pleased to invite prospective authors to submit their original manuscripts to MVAID 2022.

Submission Guides

Call for paper

Topics of interest for submission include, but are not limited to:

(1)Machine Vision

Computer Vision

Active Vision

3D-Vision

Machine Learning

Artificial Intelligence

Big data & Data mining

Deep Learning

Image Processing

Image Processing Methods

Computational Imaging

Machine Vision

Machine Vision Systems and Components

(2)Automatic Identification and Detection Technology

Artificial Intelligence Techniques in Automatic Identification

Biometrics (including face recognition)

Document Processing and Recognition

Advanced Learning Methods

Linear Models and Dimensionality Reduction

Natural Language Processing and Recognition

face and gesture recognition

Image Forensics and Identification

Microcomputer Measurement and Control Device and System

Sensor Technique & Application

Automatic Detection and Conversion Technology

Research and Application of Detection Technology and Automation Device

Control, Operation and Maintenance of Automatic Detection System

Submission Method

Full Paper Template: Download

https://www.ais.cn/attendees/material/I7FV7V

*If you request paper publication. Please submit your full paper(word+pdf) before the submission deadline: Online Submission System

https://www.ais.cn/attendees/paperSubmit/I7FV7V

Publication

All full paper submissions to the MVAID 2022 could be written in English and will be sent to at least two reviewers and evaluated based on originality, technical or research content or depth, correctness, relevance to conference, contributions, and readability. All accepted papers of MVAID 2022 will be published in the conference proceedings and will be submitted to EI Compendex, Scopus for indexing.

Contact Us

Ms. Li

Email: icmvaid163.com

QQ: 1393050893

Tel: +86-19872496992

WeChat:19872496992