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    MVAID 2022 - 2022 International Conference on Machine Vision, Automatic Identification and Detection (MVAID 2022)

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    Category Machine Vision, Automatic Identification and Detection

    Deadline: February 10, 2022 | Date: April 08, 2022-April 10, 2022

    Venue/Country: Nanjing, China, China

    Updated: 2022-01-20 10:41:45 (GMT+9)

    Call For Papers - CFP

    2022 International Conference on Machine Vision, Automatic Identification and Detection (MVAID 2022)


    April 8-10, 2022

    Nanjing, China

    Welcome to MVAID 2022

    It’s our great pleasure to invite you to join us for the 2022 International Conference on Machine Vision, Automatic Identification and Detection (MVAID 2022)[2022年机器视觉、自动识别与检测国际学术会议], which will be held on April 8-10, 2022 in Nanjing, China. MVAID 2022 will provide a forum within the international academic and engineering community in the field of Machine Vision, Automatic Identification and Detection.

    The annually-held MVAID conference aims to gather professors, researchers, scholars and industrial pioneers all over the world. MVAID is the premier forum for the presentation and exchange of past experiences and new advances and research results in the field of theoretical and industrial experience. The conference welcomes contributions which promote the exchange of ideas and rational discourse between educators and researchers all over the world. The organizing committee of conference is pleased to invite prospective authors to submit their original manuscripts to MVAID 2022.

    Submission Guides

    Call for paper

    Topics of interest for submission include, but are not limited to:

    (1)Machine Vision

    Computer Vision

    Active Vision


    Machine Learning

    Artificial Intelligence

    Big data & Data mining

    Deep Learning

    Image Processing

    Image Processing Methods

    Computational Imaging

    Machine Vision

    Machine Vision Systems and Components

    (2)Automatic Identification and Detection Technology

    Artificial Intelligence Techniques in Automatic Identification

    Biometrics (including face recognition)

    Document Processing and Recognition

    Advanced Learning Methods

    Linear Models and Dimensionality Reduction

    Natural Language Processing and Recognition

    face and gesture recognition

    Image Forensics and Identification

    Microcomputer Measurement and Control Device and System

    Sensor Technique & Application

    Automatic Detection and Conversion Technology

    Research and Application of Detection Technology and Automation Device

    Control, Operation and Maintenance of Automatic Detection System

    Submission Method

    Full Paper Template: Download

    *If you request paper publication. Please submit your full paper(word+pdf) before the submission deadline: Online Submission System


    All full paper submissions to the MVAID 2022 could be written in English and will be sent to at least two reviewers and evaluated based on originality, technical or research content or depth, correctness, relevance to conference, contributions, and readability. All accepted papers of MVAID 2022 will be published in the conference proceedings and will be submitted to EI Compendex, Scopus for indexing.

    Contact Us

    Ms. Li


    QQ: 1393050893

    Tel: +86-19872496992


    Keywords: Accepted papers list. Acceptance Rate. EI Compendex. Engineering Index. ISTP index. ISI index. Impact Factor.
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