MVAID 2022 - 2022 International Conference on Machine Vision, Automatic Identification and Detection (MVAID 2022)
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Website http://mvaid.net/ |
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Category Machine Vision, Automatic Identification and Detection
Deadline: April 12, 2022 | Date: April 22, 2022-April 24, 2022
Venue/Country: Nanjing, China, China
Updated: 2022-03-25 18:14:32 (GMT+9)
Call For Papers - CFP
2022 International Conference on Machine Vision, Automatic Identification and Detection (MVAID 2022)Homepage: http://mvaid.net/April 22-24, 2022Nanjing, ChinaWelcome to MVAID 2022It’s our great pleasure to invite you to join us for the 2022 International Conference on Machine Vision, Automatic Identification and Detection (MVAID 2022)[2022年机器视觉、自动识别与检测国际学术会议], which will be held on April 22-24, 2022 in Nanjing, China. MVAID 2022 will provide a forum within the international academic and engineering community in the field of Machine Vision, Automatic Identification and Detection.The annually-held MVAID conference aims to gather professors, researchers, scholars and industrial pioneers all over the world. MVAID is the premier forum for the presentation and exchange of past experiences and new advances and research results in the field of theoretical and industrial experience. The conference welcomes contributions which promote the exchange of ideas and rational discourse between educators and researchers all over the world. The organizing committee of conference is pleased to invite prospective authors to submit their original manuscripts to MVAID 2022.Submission GuidesCall for paperTopics of interest for submission include, but are not limited to:(1)Machine VisionComputer Vision Active Vision3D-VisionMachine LearningArtificial IntelligenceBig data & Data miningDeep LearningImage ProcessingImage Processing MethodsComputational ImagingMachine VisionMachine Vision Systems and Components(2)Automatic Identification and Detection TechnologyArtificial Intelligence Techniques in Automatic IdentificationBiometrics (including face recognition)Document Processing and RecognitionAdvanced Learning MethodsLinear Models and Dimensionality ReductionNatural Language Processing and Recognitionface and gesture recognitionImage Forensics and IdentificationMicrocomputer Measurement and Control Device and SystemSensor Technique & ApplicationAutomatic Detection and Conversion TechnologyResearch and Application of Detection Technology and Automation DeviceControl, Operation and Maintenance of Automatic Detection SystemSubmission MethodFull Paper Template: Downloadhttps://www.ais.cn/attendees/material/I7FV7V*If you request paper publication. Please submit your full paper(word+pdf) before the submission deadline: Online Submission Systemhttps://www.ais.cn/attendees/paperSubmit/I7FV7VPublicationAll full paper submissions to the MVAID 2022 could be written in English and will be sent to at least two reviewers and evaluated based on originality, technical or research content or depth, correctness, relevance to conference, contributions, and readability. All accepted papers of MVAID 2022 will be published in the conference proceedings and will be submitted to EI Compendex, Scopus for indexing.Contact UsMs. LiEmail: icmvaid163.comQQ: 1393050893Tel: +86-19872496992WeChat:19872496992
Keywords: Accepted papers list. Acceptance Rate. EI Compendex. Engineering Index. ISTP index. ISI index. Impact Factor.
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