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    2021 IEEE International Conference of Optical Imaging and Measurement (ICOIM 2021)

    View: 1022

    Website www.icoim.org | Want to Edit it Edit Freely

    Category Optical Imaging;Measurement;ICOIM 2021

    Deadline: July 25, 2021 | Date: August 27, 2021-August 29, 2021

    Venue/Country: Xi'an Jianguo Hotel, Xi 'an, China, China

    Updated: 2021-06-17 17:22:43 (GMT+9)

    Call For Papers - CFP

    Important information

    Conference Website: www.icoim.org

    Conference Date: August 27-29, 2021

    Submission Deadline: July 25,2021

    Index: EI Compendex, Scopus

    The conference has been indexed by IEEE Conference

    About ICOIM 2021

    Optical imaging and measurement are closely related and have a wide range of applications such as microscope, telescope, sensor, etc. Usually, imaging is the basis of measurement, and measurement is a rigorous consideration of imaging results in a quantitative way. This conference covers a broad field of advanced optical imaging and precision measurement technologies ranging from micro to macro, from static to dynamic, from single physical quantity to multiple. Optical methods continuously have a profound impact on the new development of science and technology, such as the milestone breakthroughs, STED optical nanoscope (Nobel Prize in Chemistry 2014) and LIGO’s interferometer (Nobel Prize in Physics 2017). This conference is looking forward to building a bridge among optical scientists, engineers and entrepreneurs.

    Ogranizer:

    Xi'an Jiaotong University

    Honorary Chair:

    1. Prof. Zhuangde Jiang, Academician of Chinese Academy of Engineering

    Conference chair:

    1. Prof. Yang Shuming, Xi 'an Jiaotong University, China

    Co-Chair: 

    1. Prof. Yiting Yu, Northwestern Polytechnical University, China

    2. Prof. Huigao Duan, Hunan University, China

    3. Prof. Ryutaro Maeda, Xi 'an Jiaotong University, China

    Technical Program Committee Chair:

    1. Prof. Xichun Luo, School of Computing and Engineering, University of Strathclyde, UK

    Publication Chair: 

    1. Prof. Zonghua Zhang, School of Mechanical Engineering, Hebei University of Technology, China

    Local Committee Chair:

    1. Chairman: Prof. Shuhai Jia, Xi 'an Jiaotong University, China

    2. Co-Chair: A/Prof. Tao Liu, Xi 'an Jiaotong University, China

    Plenary Speaker:

    1. Prof. Min Gu, Foreign member of Chinese Academy of Engineering;Fellow of Australian Academy of Science and Australian Academy of Technology and Engineering

    2. Prof. Minghui Hong, Department of Electrical & Computer Engineering of the National University of Singapore

    3. Prof. Shiyuan Liu, Huazhong University of Science and Technology

    Report title: Metrology and Inspection for IC manufacturing: State-of-the-art, challenges, and future trends

    Invited Speakers

    1. Prof. Jiwang Yan, Keio University, Japan

    2. Prof. Xichun Luo, University of Strathclyde, UK

    3. Prof. Benny Cheung, The Hong Kong Polytechnic University, Hong Kong, China

    4. Prof. Lingbao Kong, Fudan Univrsity, China

    5. Dr. Feng Gao, University of Huddersfield, UK

    6. Dr. Ping Yang, Institute of Optics and Electronics, Chinese Academy of Sciences, China

    7. Dr. Guanhao Wu, Tsinghua University, China

    8. Dr. Xiangchao Zhang, Fudan University, China

    9. Prof. Tao Li, Nanjing University, China

    10. Prof. Xiaokang Liu, Chongqing University of Technology, China

    11. Prof. Dong Wu, University of Science and Technology of China

    12. Dr. Liangcai Cao, Tsinghua University, China

    13. Prof. Yiting Yu, Northwestern Polytechnical University, China

    14. Dr. Tao Liu, Xi’an Jiaotong University, China

    15. Prof. Yongbo Deng, Changchun Institute of Optics, Fine Mechanics and Physics (CIOMP), Chinese Academy of Sciences, Changchun, China

    Call for Paper

    Topics of interest:

    1. 3D optical imaging

    2. High-resolution optical microscopy

    3. Optical nanoscopy

    4. Computational imaging

    5. Bioimaging

    6. Spectral imaging

    7. Terahertz imaging

    8. Flat optics

    9. 3D optical measurement

    10. Ladar

    11. Optical Metrology

    12. Surface topography

    13. Interferometry measurement

    14. Optical sensor

    15. Extreme measurement

    16. Online optical measurement

    17. Holographic measurement

    18. Speckle measurement

    19. New theory and technology of optical imaging and measurement

    Contact:

    Conference Secretary: Carla Wu

    If you have any inquiries, please feel free to contact us

    Email: contactaticoim.org

    Phone: +86-13922150774


    Keywords: Accepted papers list. Acceptance Rate. EI Compendex. Engineering Index. ISTP index. ISI index. Impact Factor.
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