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Third International Conference on Applied Control, Electrical and Electronics Engineering (CEEE 2017)

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Category Adaptive Control;Advanced Computing Techniques

Deadline: August 12, 2017 | Date: August 26, 2017-August 27, 2017

Venue/Country: Dubai, UAE, United Arab Emirates

Updated: 2017-08-07 18:35:13 (GMT+9)

Call For Papers - CFP

August 26~27, 2017, Dubai, UAE

Call for Papers

Third International Conference on Applied Control, Electrical and Electronics Engineering (CEEE 2017) will provide an excellent international forum for sharing knowledge and results in theory, methodology and applications Applied Control Systems, Electrical Engineering and Electronics Engineering. The goal of this conference is to bring together researchers and practitioners from academia and industry to focus on understanding Modern software engineering concepts and establishing new collaborations in these areas.

Topics of interest include, but are not limited to, the following:

Adaptive Control

Advanced Computing Techniques

Advanced Control Techniques

Applications of Control Theory in Industry


Biomedical Engineering

Chaos Theory and Control

Communication Engineering

Computers and Information Technology

Computer Vision

Control Applications

Digital Electronics

Digital Image Processing

Digital Signal Processing

Electric Energy and Automation

Electronics and Communication Engineering

Evolutionary Algorithms

Fault Detection and Isolation


Flight Control and Surveillance Systems

Fuzzy logic and Control

Genetic Algorithms and Applications

Genetic Algorithms and Evolutionary Computing

Guidance Control Systems

Image Processing

Industrial Applications

Industrial Automation

Industry, Military, Space Applications

Instrumentation and Control Components

Intelligent Systems

Linear and Nonlinear Control Systems

Mathematical and Computer Modeling

Measurement Techniques

Network Based Systems

Networks and Computing

Neural Networks and Fuzzy logic

Optimization and Optimal Control

Pattern Recognition

Power Electronics

Power Systems

Process Control and Instrumentation

Robotics and Applications

Robust Control

Sampled-Data Control Systems and Digital Control

Scientific and Engineering Modeling

Secure Communication

Signal Processing

Soft Computing Techniques in Control

Stochastic Control and Filtering

System Identification and Control

System Modeling and Control

Systems and Automation




Paper Submission

Authors are invited to submit papers through the Conference Submission System by August 12, 2017. Submissions must be original and should not have been published previously or be under consideration for publication while being evaluated for this conference. The proceedings of the conference will be published as a Special Issue in International Journal of Applied Control, Electrical and Electronics Engineering (IJACEEE) (Confirmed).

Extended version of the selected papers from CEEE 2017 will be published as special issue in the following journals.

International Journal of Instrumentation and Control Systems (IJICS)

International Journal of Control Theory and Computer Modeling (IJCTCM)

International Journal of Information Technology, Control and Automation (IJITCA)

Circuits and Systems: An International Journal (CSIJ)

Emerging Trends in Electrical, Electronics & Instrumentation Engineering: An international Journal (EEIEJ)

Electrical Engineering: An International Journal (EEIJ)

Important Dates

Submission Deadline : August 12, 2017

Authors Notification :August 20, 2017

Registration & Camera-Ready Paper Due : August 22, 2017

Keywords: Accepted papers list. Acceptance Rate. EI Compendex. Engineering Index. ISTP index. ISI index. Impact Factor.
Disclaimer: ourGlocal is an open academical resource system, which anyone can edit or update. Usually, journal information updated by us, journal managers or others. So the information is old or wrong now. Specially, impact factor is changing every year. Even it was correct when updated, it may have been changed now. So please go to Thomson Reuters to confirm latest value about Journal impact factor.