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    ICSPD 2017 - The 4th Int'l Conference on Semiconductor Physics and Devices (ICSPD 2017)

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    Website http://www.engii.org/conference/ICSPD/ | Want to Edit it Edit Freely

    Category Semiconductor Physics and Devices

    Deadline: August 11, 2017 | Date: September 24, 2017-September 26, 2017

    Venue/Country: Suzhou, China

    Updated: 2017-03-22 10:17:06 (GMT+9)

    Call For Papers - CFP

    Conference Issues

    Physics of Semiconductors

    Semiconductor Spintronics / Topological Insulators

    Wide/narrow Band-gap Semiconductors

    Semiconductor Lower Dimensions and Nanostructures

    High Magnetic Fields / High Pressure in Semiconductor Physics

    Ferromagnetism / Magnetic Semiconductors

    Impurities/Defects in Semiconductors

    Photophysics & Transient Absorption Spectroscopy/Measurements

    Surface and Interface Physics

    Semiconductor Quantum Dots / Quantum Hall Effects / Quantum Information

    Semiconductor Materials and Applications / Semiconductor Processing

    Complex Oxides

    Organic Semiconductors

    Compound Semiconductors

    Light Emitting Diodes (LEDs) and Diode Lasers

    Photoelectric and Photovoltaic Devices

    Semiconductor Detectors

    Device Design and Fabrication

    Device Performance and Reliability

    Emerging Semiconductor Technologies

    Novel Semiconductor Devices and Applications

    Please register through http://www.engii.org/RegistrationSubmission/default.aspx?ConferenceID=931&utm_source=p2p&utm_campaign=papersubmission&utm_medium=LJ

    Keywords: Accepted papers list. Acceptance Rate. EI Compendex. Engineering Index. ISTP index. ISI index. Impact Factor.
    Disclaimer: ourGlocal is an open academical resource system, which anyone can edit or update. Usually, journal information updated by us, journal managers or others. So the information is old or wrong now. Specially, impact factor is changing every year. Even it was correct when updated, it may have been changed now. So please go to Thomson Reuters to confirm latest value about Journal impact factor.